• 154 Downloads • Abstract The defect structure of multiwalled carbon nanotubes has been studied by transmission electron microscopy and Raman spectroscopy, with particular attention to the shape and intensity of the defect band D and its overtone D*. Electron-microscopic results demonstrate that multiwalled nanotubes typically have multiple bends. The associated short- and long-range disorder influences the Raman spectrum of the nanotubes. The presence of several defect species, differing in scattering probability, results in a stochastic relationship between the intensities of the D*- and D-bands.

This relationship is qualitatively interpreted in terms of general mechanisms of elastic/inelastic interactions of π-electrons with phonons and defects. Dell latitude d620 sim card slot driver download for laptop.

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